Products

We propose current transformers and/ or analog electronics, according to your measurement type and beam structure. Contact us for technical advices.

To find your product, please filter the diagnostic you wish and the beam you have. Or please scroll the product list to get more detailed information

Diagnostics

Beam Structure

  • Non-destructive DC beam current measurement

    NPCT

    Non-destructive DC beam current measurement
    • Full Scale Range ±20 mA, ±200 mA, ±2 A and ±20 A
    • Resolution down to 0.5 µA rms/√(Hz)
    • Output Bandwidth from DC to 10 kHz (-3dB)
    • Linearity error ≤ 0.1 %
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  • CR-BCM

    Current measurement with sub-nanoamperes resolution of CW beams and macropulses
    • Beam repetition frequency from 30 MHz to 175 MHz
    • Response time  < 1 µs
    • 100 mm axial length
    • 300 mm external diameter
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  • Precise waveform measurement of long pulses

    ACCT

    Precise waveform measurement of long pulses
    • Full Scale Range from ±1 mA to ±2 A
    • Single Range or 3 Selectable-Range
    • Resolution ≤ 1.5 µArms
    • Droop ≤ 2 %/ms
    • Bandwidth from 3 Hz to 1 MHz (-3dB)
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  • Precise average current measurement of CW beams or macropulses

    CWCT & BCM-CW-E

    Precise average current measurement of CW beams or macropulses
    • Resolution of 1 µArms
    • With Low Current option: ≤ 8 nA rms resolution
    • Operating Frequency from 15 MHz to 200 MHz
    • Response Time of 1 µs
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  • Very fast non-destructive pulsed or CW beams observation

    FCT

    Very fast non-destructive pulsed or CW beams observation
    • Sensitivity from 0.25 to 5 V/A
    • Bandwidth up to 1.5 GHz
    • Rise time ≤ 230 ps
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  • Beam charge measurement

    ICT & BCM-IHR-E

    Beam charge measurement
    • Sensitivity (ICT alone) from 0.25 to 10 Vs/C
    • Full Scale range from 800 pC to 400 nC
    • Noise on single bunch of 0.55 pC
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  • Ultra short bunch and very low charge measurement

    Turbo-ICT & BCM-RF-E

    Ultra short bunch and very low charge measurement
    • Bunch length ≤ 100 ps
    • Resolution of 10 fCrms or 1 % of a single pulse charge
    • Bunch repetition rate ≤ 2 MHz
    • Possible to get digitized output with BCM-RF-DAQ
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  • Industrial non-destructive DC beam current measurement

    IPCT

    Industrial non-destructive DC current measurement
    • Full Scale Range from ±1 mA to ±20 A
    • 10 µA resolution over 1 second
    • Output Bandwidth from DC to 3.8 kHz (-3dB)
    • Aperture of 82 mm (3.23”)
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  • LR-BPM

    LR-BPM

    Log-Ratio BPM Electronics
    • Resolution X & Y Pickup aperture radius / 10'000
    • Dynamic Range > 50 dB
    • Operating Frequency ≤ 500 MHz
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  • S-BPM

    S-BPM

    Single-pass bunch position measurement for S-band beams
    • Resolution X & Y is pickup aperture radius / 10'000
    • Dynamic Range > 50 dB
    • Operating Frequency of 2.856 GHz and 2.999 GHz
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  • Single-pass bunch position measurement for low repetition rate

    BB-BPM

    Single-pass bunch position measurement for low repetition rate
    • Resolution X & Y is pickup diameter / 1000
    • Dynamic Range > 70 dB
    • Operating Frequency from 200 kHz to 25 MHz
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  • Multi-pass or CW beam position measurement

    MX-BPM

    Multi-pass or CW beam position measurement
    • Resolution X & Y down to 1 µm
    • Dynamic Range > 75 dB
    • Operating Frequency from 60 MHz to 500 MHz
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  • Low-cost predicted beam loss counting

    BLM

    Low-cost predicted beam loss counting
    • Single particle detection efficiency > 30 %
    • Spurious count rate < 0.1 Hz
    • Maximum count rate > 10 MHz
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